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Information card for entry 7032103
Preview
| Coordinates | 7032103.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C181 H147.5 B8 F32 Fe4 N48.5 O13 |
|---|---|
| Calculated formula | C176 H138 B8 F32 Fe4 N46 O13 |
| SMILES | [Fe]12345[N](c6ccc(Oc7nc8Oc9ccc([N]%10[Fe]%11%12%13([n]%14c(C=[N]%11c%11ccc(Oc%15nc(Oc%16ccc([N]5=Cc5[n]4cccc5)cc%16)nc(Oc4ccc([N]5[Fe]%16%17%18([N](c%19ccc(Oc%20nc(Oc%21ccc([N]1=Cc1[n]2cccc1)cc%21)nc(Oc1ccc([N]2[Fe]%21%22([N](c%23ccc(Oc(n8)n7)cc%23)=Cc7[n]%21cccc7)([N](c7ccc(Oc8nc(Oc%21ccc([N]%12=Cc%12[n]%13cccc%12)cc%21)nc(Oc%12ccc([N]%16=Cc%13[n]%17cccc%13)cc%12)n8)cc7)=Cc7[n]%22cccc7)[n]7ccccc7C=2)cc1)n%20)cc%19)=Cc1[n]%18cccc1)[n]1c(C=5)cccc1)cc4)n%15)cc%11)cccc%14)[n]1c(cccc1)C=%10)cc9)cc6)=Cc1[n]3cccc1.N#CC.N#CC.O.[B](F)(F)(F)[F-].[B](F)(F)(F)[F-].[B](F)(F)(F)[F-].[B](F)(F)(F)[F-].[B](F)(F)(F)[F-].N#CC.[B](F)(F)(F)[F-].[B](F)(F)(F)[F-].C(#N)C.N#CC.N#CC.N#CC.N#CC.N#CC.[B](F)(F)(F)[F-].N#CC |
| Title of publication | Variation of guest selectivity within [Fe4L4](8+) tetrahedral cages through subtle modification of the face-capping ligand. |
| Authors of publication | Ferguson, Alan; Staniland, Robert W.; Fitchett, Christopher M.; Squire, Marie A.; Williamson, Bryce E.; Kruger, Paul E. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2014 |
| Journal volume | 43 |
| Journal issue | 39 |
| Pages of publication | 14550 - 14553 |
| a | 21.8 ± 0.004 Å |
| b | 22.237 ± 0.004 Å |
| c | 22.317 ± 0.005 Å |
| α | 103.56 ± 0.03° |
| β | 95.35 ± 0.03° |
| γ | 115.89 ± 0.03° |
| Cell volume | 9222 ± 5 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1579 |
| Residual factor for significantly intense reflections | 0.1325 |
| Weighted residual factors for significantly intense reflections | 0.3831 |
| Weighted residual factors for all reflections included in the refinement | 0.402 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.619 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7032103.html
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