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Information card for entry 7032520
Preview
| Coordinates | 7032520.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C78 H112 O6 Se2 Th |
|---|---|
| Calculated formula | C78 H112 O6 Se2 Th |
| Title of publication | Stabilization of M(IV) = Ti, Zr, Hf, Ce, and Th using a selenium bis(phenolate) ligand. |
| Authors of publication | Behrle, Andrew C.; Levin, Jessica R.; Kim, Jee Eon; Drewett, Jonathan M.; Barnes, Charles L.; Schelter, Eric J.; Walensky, Justin R. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2015 |
| Journal volume | 44 |
| Journal issue | 6 |
| Pages of publication | 2693 - 2702 |
| a | 10.6511 ± 0.0019 Å |
| b | 20.51 ± 0.004 Å |
| c | 17.812 ± 0.003 Å |
| α | 90° |
| β | 104.68 ± 0.002° |
| γ | 90° |
| Cell volume | 3764.1 ± 1.2 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0373 |
| Residual factor for significantly intense reflections | 0.0272 |
| Weighted residual factors for significantly intense reflections | 0.0505 |
| Weighted residual factors for all reflections included in the refinement | 0.0532 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.92 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7032520.html
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