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Information card for entry 7032613
Preview
| Coordinates | 7032613.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Tantalum pentachloride dimethyltelluride |
|---|---|
| Formula | C2 H6 Cl5 Ta Te |
| Calculated formula | C2 H6 Cl5 Ta Te |
| SMILES | Cl[Ta](Cl)(Cl)([Te](C)C)(Cl)Cl |
| Title of publication | Niobium(v) and tantalum(v) halide chalcogenoether complexes - towards single source CVD precursors for ME2 thin films. |
| Authors of publication | Benjamin, Sophie L.; Chang, Yao-Pang; Gurnani, Chitra; Hector, Andrew L.; Huggon, Michelle; Levason, William; Reid, Gillian |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2014 |
| Journal volume | 43 |
| Journal issue | 44 |
| Pages of publication | 16640 - 16648 |
| a | 8.023 ± 0.005 Å |
| b | 11.998 ± 0.007 Å |
| c | 10.752 ± 0.006 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1035 ± 1.1 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 36 |
| Hermann-Mauguin space group symbol | C m c 21 |
| Hall space group symbol | C 2c -2 |
| Residual factor for all reflections | 0.0681 |
| Residual factor for significantly intense reflections | 0.0634 |
| Weighted residual factors for significantly intense reflections | 0.1581 |
| Weighted residual factors for all reflections included in the refinement | 0.1645 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.132 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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