Information card for entry 7033257

Structure parameters

• Formula: C120 H104 O16 Sb8 Te4
• Calculated formula: C120 H100 O16 Sb8 Te4
• SMILES: c1(ccccc1)[Sb]123(c4ccccc4)O[Sb]([O-])O[Sb](O[Sb]4(O[Sb]5(O[Sb]67(O[Sb](O[Sb](c8ccccc8)(c8ccccc8)(O5)(O6)O7)[O-])(c5ccccc5)c5ccccc5)O4)O1)(O2)(O3)(c1ccccc1)c1ccccc1.c1(ccccc1)[Te+](c1ccccc1)c1ccccc1.c1(ccccc1)[Te+](c1ccccc1)c1ccccc1.c1(ccccc1)[Te+](c1ccccc1)c1ccccc1.c1(ccccc1)[Te+](c1ccccc1)c1ccccc1
• Title of publication: Assembling anionic Sb(v)/(iii) containing polyoxostibonates stabilized by triphenyltellurium cations.
• Authors of publication: Srungavruksham, Nagarjuna Kumar; Baskar, Viswanathan
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2015
• Journal volume: 44
• Journal issue: 14
• Pages of publication: 6358 - 6362
• a: 16.709 ± 0.002 Å
• b: 16.711 ± 0.002 Å
• c: 19.386 ± 0.002 Å
• α: 90°
• β: 90.193 ± 0.002°
• γ: 90°
• Cell volume: 5413 ± 1.1 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0495
• Residual factor for significantly intense reflections: 0.0442
• Weighted residual factors for significantly intense reflections: 0.1032
• Weighted residual factors for all reflections included in the refinement: 0.1061
• Goodness-of-fit parameter for all reflections included in the refinement: 1.123
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No