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Information card for entry 7033789
Preview
| Coordinates | 7033789.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C19 H43 Ag N2 Si3 |
|---|---|
| Calculated formula | C19 H43 Ag N2 Si3 |
| SMILES | [Ag]([Si]([Si](C)(C)C)([Si](C)(C)C)CC)=C1N(C=CN1C(C)(C)C)C(C)(C)C |
| Title of publication | Synthesis, structural characterization and thermal properties of copper and silver silyl complexes. |
| Authors of publication | Sgro, Michael J.; Piers, Warren E.; Romero, Patricio E. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2015 |
| Journal volume | 44 |
| Journal issue | 8 |
| Pages of publication | 3817 - 3828 |
| a | 10.8059 ± 0.0004 Å |
| b | 11.9323 ± 0.0004 Å |
| c | 11.9508 ± 0.0004 Å |
| α | 72.469 ± 0.002° |
| β | 75.151 ± 0.002° |
| γ | 70.359 ± 0.002° |
| Cell volume | 1363.09 ± 0.08 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0278 |
| Residual factor for significantly intense reflections | 0.0273 |
| Weighted residual factors for significantly intense reflections | 0.0737 |
| Weighted residual factors for all reflections included in the refinement | 0.0742 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.084 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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