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Information card for entry 7033861
Preview
| Coordinates | 7033861.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H34 Cl6 N4 O2 Si |
|---|---|
| Calculated formula | C33.998 H33.998 Cl5.994 N4 O2 Si |
| Title of publication | Tp*Cu(i)-CN-SiL2-NC-Cu(i)Tp* - a hexacoordinate Si-complex as connector for redox active metals via π-conjugated ligands. |
| Authors of publication | Kämpfe, Alexander; Brendler, Erica; Kroke, Edwin; Wagler, Jörg |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2015 |
| Journal volume | 44 |
| Journal issue | 10 |
| Pages of publication | 4744 - 4750 |
| a | 7.1083 ± 0.0006 Å |
| b | 10.0939 ± 0.0009 Å |
| c | 13.448 ± 0.0013 Å |
| α | 92.222 ± 0.007° |
| β | 96.813 ± 0.007° |
| γ | 100.341 ± 0.007° |
| Cell volume | 940.74 ± 0.15 Å3 |
| Cell temperature | 180 ± 2 K |
| Ambient diffraction temperature | 180 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0649 |
| Residual factor for significantly intense reflections | 0.0464 |
| Weighted residual factors for significantly intense reflections | 0.1059 |
| Weighted residual factors for all reflections included in the refinement | 0.1141 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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