Information card for entry 7034643

Structure parameters

• Formula: C70 H122 N6 O Si4 Zn4
• Calculated formula: C70 H116 Hy6 N6 O Si4 Zn4
• SMILES: [Zn]12([H][Zn]3([H][Zn]([H]1)([H][Zn]([H]2)([H]3)N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C)=C1N(C=CN1c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C)=C1N(C=CN1c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C.O1CCCC1
• Title of publication: Two alternative approaches to access mixed hydride-amido zinc complexes: synthetic, structural and solution implications.
• Authors of publication: Roberts, Andrew J.; Clegg, William; Kennedy, Alan R.; Probert, Michael R.; Robertson, Stuart D.; Hevia, Eva
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2015
• Journal volume: 44
• Journal issue: 17
• Pages of publication: 8169 - 8177
• a: 22.153 ± 0.007 Å
• b: 16.412 ± 0.005 Å
• c: 22.139 ± 0.007 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 8049 ± 4 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 6
• Space group number: 33
• Hermann-Mauguin space group symbol: P n a 21
• Hall space group symbol: P 2c -2n
• Residual factor for all reflections: 0.0787
• Residual factor for significantly intense reflections: 0.0629
• Weighted residual factors for significantly intense reflections: 0.1666
• Weighted residual factors for all reflections included in the refinement: 0.1767
• Goodness-of-fit parameter for all reflections included in the refinement: 1.053
• Diffraction radiation wavelength: 0.6889 Å
• Diffraction radiation type: synchrotron
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No