Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7035347
Preview
| Coordinates | 7035347.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C19 H11 F8 N3 Ni |
|---|---|
| Calculated formula | C19 H11 F8 N3 Ni |
| SMILES | [Ni]12([n]3c(c4[n]1cccc4)cccc3c1ncccc1)C(F)(F)C(F)(F)C(F)(F)C2(F)F |
| Title of publication | Accessing perfluoroalkyl nickel(ii), (iii), and (iv) complexes bearing a readily attached [C4F8] ligand. |
| Authors of publication | Yu, S.; Dudkina, Y.; Wang, H.; Kholin, K. V.; Kadirov, M. K.; Budnikova, Y. H.; Vicic, D. A. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2015 |
| Journal volume | 44 |
| Journal issue | 45 |
| Pages of publication | 19443 - 19446 |
| a | 10.2036 ± 0.0019 Å |
| b | 10.296 ± 0.002 Å |
| c | 10.3028 ± 0.0019 Å |
| α | 62.689 ± 0.004° |
| β | 67.126 ± 0.004° |
| γ | 75.991 ± 0.004° |
| Cell volume | 883.4 ± 0.3 Å3 |
| Cell temperature | 130 ± 2 K |
| Ambient diffraction temperature | 130 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0693 |
| Residual factor for significantly intense reflections | 0.0514 |
| Weighted residual factors for significantly intense reflections | 0.1037 |
| Weighted residual factors for all reflections included in the refinement | 0.1118 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.137 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7035347.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.