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Information card for entry 7035402
Preview
| Coordinates | 7035402.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H30 N4 Ni O S |
|---|---|
| Calculated formula | C20 H30 N4 Ni O S |
| SMILES | [Ni]123[N](=C(C(=[N]3N=C(S1)NC)C)C)c1c(O2)c(cc(c1)C(C)(C)C)C(C)(C)C |
| Title of publication | Nickel(ii) radical complexes of thiosemicarbazone ligands appended by salicylidene, aminophenol and aminothiophenol moieties. |
| Authors of publication | Kochem, Amélie; Gellon, Gisèle; Jarjayes, Olivier; Philouze, Christian; du Moulinet d'Hardemare, Amaury; van Gastel, Maurice; Thomas, Fabrice |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2015 |
| Journal volume | 44 |
| Journal issue | 28 |
| Pages of publication | 12743 - 12756 |
| a | 28.625 ± 0.006 Å |
| b | 8.7282 ± 0.0012 Å |
| c | 17.707 ± 0.004 Å |
| α | 90° |
| β | 97.69 ± 0.017° |
| γ | 90° |
| Cell volume | 4384.2 ± 1.5 Å3 |
| Cell temperature | 200 K |
| Ambient diffraction temperature | 200 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.064 |
| Residual factor for significantly intense reflections | 0.0356 |
| Weighted residual factors for significantly intense reflections | 0.0801 |
| Weighted residual factors for all reflections included in the refinement | 0.0927 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.055 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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