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Information card for entry 7038676
Preview
| Coordinates | 7038676.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H22 Cl4 K2 O3 Pt S4 |
|---|---|
| Calculated formula | C20 H22 Cl4 K2 O3 Pt S4 |
| SMILES | c12c(Cl)ccc(Cl)c1S[Pt]1(S2)Sc2c(ccc(c2S1)Cl)Cl.C1CCCO1.C1CCCO1.[K+].[K+].O |
| Title of publication | Unprecedented layered coordination polymers of dithiolene group 10 metals: magnetic and electrical properties. |
| Authors of publication | Delgado, Esther; Gómez-García, Carlos J; Hernández, Diego; Hernández, Elisa; Martín, Avelino; Zamora, Félix |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2016 |
| Journal volume | 45 |
| Journal issue | 15 |
| Pages of publication | 6696 - 6701 |
| a | 8.2056 ± 0.0007 Å |
| b | 12.7042 ± 0.0011 Å |
| c | 14.4749 ± 0.0008 Å |
| α | 82.782 ± 0.005° |
| β | 74.848 ± 0.005° |
| γ | 76.633 ± 0.007° |
| Cell volume | 1413.6 ± 0.2 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.099 |
| Residual factor for significantly intense reflections | 0.0639 |
| Weighted residual factors for significantly intense reflections | 0.1441 |
| Weighted residual factors for all reflections included in the refinement | 0.1585 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.228 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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