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Information card for entry 7040244
Preview
| Coordinates | 7040244.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H16 N4 O2 Sn2 |
|---|---|
| Calculated formula | C22 H16 N4 O2 Sn2 |
| SMILES | C1=[N]2c3ccccc3[O]3[Sn]45n6cccc6C=[N]4c4ccccc4[O]5[Sn]23n2cccc12 |
| Title of publication | Group 10-group 14 metal complexes [E-TM](IV): the role of the group 14 site as an L, X and Z-type ligand. |
| Authors of publication | Wächtler, Erik; Gericke, Robert; Brendler, Erica; Gerke, Birgit; Langer, Thorsten; Pöttgen, Rainer; Zhechkov, Lyuben; Heine, Thomas; Wagler, Jörg |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2016 |
| Journal volume | 45 |
| Journal issue | 36 |
| Pages of publication | 14252 - 14264 |
| a | 12.0878 ± 0.0002 Å |
| b | 10.4438 ± 0.0002 Å |
| c | 15.6612 ± 0.0003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1977.11 ± 0.06 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 60 |
| Hermann-Mauguin space group symbol | P b c n |
| Hall space group symbol | -P 2n 2ab |
| Residual factor for all reflections | 0.0364 |
| Residual factor for significantly intense reflections | 0.0222 |
| Weighted residual factors for significantly intense reflections | 0.0544 |
| Weighted residual factors for all reflections included in the refinement | 0.0579 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.042 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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