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Information card for entry 7041387
Preview
| Coordinates | 7041387.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Triphos(Si)Ni(CH2PPh2) BF4 |
|---|---|
| Chemical name | Triphos(Si)Ni(CH2PPh2) BF4 |
| Formula | C55 H54 B F4 N Ni P4 Si |
| Calculated formula | C55 H54 B F4 N Ni P4 Si |
| Title of publication | Spontaneous Si-C bond cleavage in (Triphos(Si))-nickel complexes. |
| Authors of publication | Petuker, Anette; Mebs, Stefan; Schuth, Nils; Gerschel, Philipp; Reback, Matthew L.; Mallick, Bert; van Gastel, Maurice; Haumann, Michael; Apfel, Ulf-Peter |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2017 |
| Journal volume | 46 |
| Journal issue | 3 |
| Pages of publication | 907 - 917 |
| a | 10.3301 ± 0.0001 Å |
| b | 20.6239 ± 0.0002 Å |
| c | 23.6859 ± 0.0002 Å |
| α | 90° |
| β | 90.01 ± 0.02° |
| γ | 90° |
| Cell volume | 5046.21 ± 0.08 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0342 |
| Residual factor for significantly intense reflections | 0.0331 |
| Weighted residual factors for significantly intense reflections | 0.0838 |
| Weighted residual factors for all reflections included in the refinement | 0.0846 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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