Information card for entry 7041563

Structure parameters

• Chemical name: [Cp*Yb]2(μ:η5,η5-Pn?)
• Formula: C54 H100 Si4 Yb2
• Calculated formula: C54 H100 Si4 Yb2
• SMILES: [c]12([cH]3[cH]4[c]567[c]81([cH]1[cH]9[c]6([Si](C(C)C)(C(C)C)C(C)C)[Yb]6%10%11%127819[c]1([c]%12([c]%11([c]%10([c]61C)C)C)C)C)[Yb]16782345[c]2([c]8([c]7([c]6([c]12C)C)C)C)C)[Si](C(C)C)(C(C)C)C(C)C.C[Si](C)(C)C.C[Si](C)(C)C
• Title of publication: A base-free synthetic route to anti-bimetallic lanthanide pentalene complexes.
• Authors of publication: Kilpatrick, Alexander F. R.; Cloke, F Geoffrey N
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2017
• Journal volume: 46
• Journal issue: 17
• Pages of publication: 5587 - 5597
• a: 13.133 ± 0.003 Å
• b: 17.767 ± 0.004 Å
• c: 13.725 ± 0.003 Å
• α: 90°
• β: 114.1 ± 0.03°
• γ: 90°
• Cell volume: 2923.4 ± 1.3 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173.15 K
• Number of distinct elements: 4
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0909
• Residual factor for significantly intense reflections: 0.0464
• Weighted residual factors for significantly intense reflections: 0.0814
• Weighted residual factors for all reflections included in the refinement: 0.0952
• Goodness-of-fit parameter for all reflections included in the refinement: 1.015
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No