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Information card for entry 7042038
Preview
| Coordinates | 7042038.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | S,S-Bis(2-hydroxypropylthio)(ethylenedithio)tetrathiafulvalene.triodide. Semiconducting phase, Z=6 |
|---|---|
| Formula | C14 H18 I3 O2 S8 |
| Calculated formula | C14 H18 I3 O2 S8 |
| Title of publication | Enantiopure and racemic radical-cation salts of bis(2'-hydroxylpropylthio)(ethylenedithio)TTF with polyiodide anions. |
| Authors of publication | Martin, Lee; Wallis, John D.; Guziak, Milena; Maksymiw, Peter; Konalian-Kempf, Florence; Christian, Anthony; Nakatsuji, Shin'ichi; Yamada, Jun'ichi; Akutsu, Hiroki |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2017 |
| Journal volume | 46 |
| Journal issue | 13 |
| Pages of publication | 4225 - 4234 |
| a | 10.015 ± 0.003 Å |
| b | 16.004 ± 0.004 Å |
| c | 24.666 ± 0.006 Å |
| α | 91.869 ± 0.006° |
| β | 100.996 ± 0.007° |
| γ | 95.386 ± 0.008° |
| Cell volume | 3858.6 ± 1.8 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 1 |
| Hermann-Mauguin space group symbol | P 1 |
| Hall space group symbol | P 1 |
| Residual factor for all reflections | 0.1079 |
| Residual factor for significantly intense reflections | 0.0645 |
| Weighted residual factors for significantly intense reflections | 0.166 |
| Weighted residual factors for all reflections included in the refinement | 0.2064 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.071 |
| Diffraction radiation wavelength | 0.710747 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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