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Information card for entry 7042172
Preview
| Coordinates | 7042172.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H45 Cl N4 Pd |
|---|---|
| Calculated formula | C42 H45 Cl N4 Pd |
| SMILES | [Pd]12(Cl)(=C3N(c4c(ccc5ccccc45)N4CCCCC4)CCN3c3c(ccc4ccccc34)N3CCCCC3)[CH](=[CH]1C2)c1ccccc1 |
| Title of publication | New, potentially chelating NHC ligands; synthesis, complexation studies, and preliminary catalytic evaluation. |
| Authors of publication | Ou, Arnold; Wu, Linglin; Salvador, Alvaro; Sipos, Gellert; Zhao, Guangzhen; Skelton, Brian W.; Sobolev, Alexandre N.; Dorta, Reto |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2017 |
| Journal volume | 46 |
| Journal issue | 11 |
| Pages of publication | 3631 - 3641 |
| a | 86.5994 ± 0.0008 Å |
| b | 25.6783 ± 0.0003 Å |
| c | 12.9003 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 28686.7 ± 0.6 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 43 |
| Hermann-Mauguin space group symbol | F d d 2 |
| Hall space group symbol | F 2 -2d |
| Residual factor for all reflections | 0.0689 |
| Residual factor for significantly intense reflections | 0.0651 |
| Weighted residual factors for significantly intense reflections | 0.145 |
| Weighted residual factors for all reflections included in the refinement | 0.147 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.192 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7042172.html
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