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Information card for entry 7042672
Preview
| Coordinates | 7042672.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H30 Br2 N4 Pd Se |
|---|---|
| Calculated formula | C32 H30 Br2 N4 Pd Se |
| SMILES | C(c1ccccc1)N1c2ccccc2N2C1=[Pd]1(=C3N(c4c(cccc4)N3CC[Se]1CC2)Cc1ccccc1)Br.[Br-] |
| Title of publication | Hg(II) and Pd(II) complexes with a new selenoether bridged biscarbene ligand: Efficient mono- and bis-arylation of methyl acrylate with a pincer biscarbene Pd(II) precatalyst |
| Authors of publication | Dhiman, Rishu; Prashanth, Billa; Bawari, Deependra; Mandal, Ushnish; Verma, Aditya; Roychoudhury, Angshuman; Singh, Sanjay |
| Journal of publication | Dalton Trans. |
| Year of publication | 2017 |
| a | 30.8531 ± 0.0018 Å |
| b | 10.9709 ± 0.0007 Å |
| c | 17.1227 ± 0.001 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 5795.8 ± 0.6 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 6 |
| Space group number | 60 |
| Hermann-Mauguin space group symbol | P b c n |
| Hall space group symbol | -P 2n 2ab |
| Residual factor for all reflections | 0.0566 |
| Residual factor for significantly intense reflections | 0.0423 |
| Weighted residual factors for significantly intense reflections | 0.1018 |
| Weighted residual factors for all reflections included in the refinement | 0.1096 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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