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Information card for entry 7043715
Preview
| Coordinates | 7043715.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H57 Cl2 N7 Ni O16 |
|---|---|
| Calculated formula | C42 H55 Cl2 N7 Ni O16 |
| SMILES | [Ni]123([n]4ccccc4c4cccc[n]14)([NH]1CC[NH]3CC[NH]2Cc2ccc(cc2)OCC(=O)NCc2cc(CNC(=O)COc3ccc(cc3)C1)ccc2)[OH2].Cl(=O)(=O)(=O)[O-].Cl(=O)(=O)(=O)[O-].OC.O.OC |
| Title of publication | Syntheses of metallo-pseudorotaxanes, rotaxane and post-synthetically functionalized rotaxane: a comprehensive spectroscopic study and dynamic properties |
| Authors of publication | Ghosh, Pradyut; Santra, Saikat; Bej, Somnath; Nandi, Mandira; Mondal, Partha |
| Journal of publication | Dalton Trans. |
| Year of publication | 2017 |
| a | 13.4733 ± 0.0008 Å |
| b | 18.3502 ± 0.001 Å |
| c | 19.0508 ± 0.0011 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4710.1 ± 0.5 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0992 |
| Residual factor for significantly intense reflections | 0.0774 |
| Weighted residual factors for significantly intense reflections | 0.1962 |
| Weighted residual factors for all reflections included in the refinement | 0.2168 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.03 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7043715.html
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