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Information card for entry 7044276
Preview
| Coordinates | 7044276.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H38 Rh2 S4 |
|---|---|
| Calculated formula | C32 H38 Rh2 S4 |
| SMILES | c12c(cccc1)[S]1[Rh]3456([c]7([c]3([c]4([c]5([c]67C)C)C)C)C)(S2)[S]2c3c(cccc3)S[Rh]345612[c]1([c]3([c]4([c]5([c]61C)C)C)C)C |
| Title of publication | Pseudo electron-deficient organometallics: limited reactivity towards electron-donating ligands |
| Authors of publication | Pitto-Barry, Anaïs; Lupan, Alexandru; Zegke, Markus; Swift, Thomas; Attia, Amr A. A.; Lord, Rianne M.; Barry, Nicolas P. E. |
| Journal of publication | Dalton Trans. |
| Year of publication | 2017 |
| a | 8.0369 ± 0.0003 Å |
| b | 10.5256 ± 0.0003 Å |
| c | 10.8572 ± 0.0004 Å |
| α | 61.544 ± 0.001° |
| β | 69.296 ± 0.001° |
| γ | 79.238 ± 0.002° |
| Cell volume | 755.15 ± 0.05 Å3 |
| Cell temperature | 170 ± 2 K |
| Ambient diffraction temperature | 170 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0324 |
| Residual factor for significantly intense reflections | 0.0321 |
| Weighted residual factors for significantly intense reflections | 0.0811 |
| Weighted residual factors for all reflections included in the refinement | 0.0814 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.104 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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