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Information card for entry 7045040
Preview
| Coordinates | 7045040.cif |
|---|---|
| Original paper (by DOI) | HTML |
| External links | PubChem |
| Formula | C212 H220 Au12 B2 Cl8 O12 P10 S4 Si8 |
|---|---|
| Calculated formula | C212 H220 Au12 B2 Cl8 O12 P10 S4 Si8 |
| SMILES | [B-](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1.c1(ccccc1)[P]1(c2ccccc2)[Au]2[S]3[Au]45[Au]([P](c6ccccc6)([Au][S]6[Au]7[P](c8ccccc8)(c8ccccc8)c8c(O[Si](C)(C)C)oc(O[Si](C)(C)C)c8[P]([Au]7[S]7[Au]8[P](c9ccccc9)(c9ccccc9)c9c(O[Si](C)(C)C)oc(O[Si](C)(C)C)c9[P]([Au]68[Au]7[P]([Au]3)(c3ccccc3)c3ccccc3)(c3ccccc3)c3ccccc3)(c3ccccc3)c3ccccc3)c3ccccc3)[S]([Au]2[P](c2c1c(O[Si](C)(C)C)oc2O[Si](C)(C)C)(c1ccccc1)c1ccccc1)[Au]5[P](c1ccccc1)(c1ccccc1)c1c(O[Si](C)(C)C)oc(O[Si](C)(C)C)c1[P]4(c1ccccc1)c1ccccc1.ClCCl.ClCCl.[B-](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1.ClCCl.ClCCl |
| Title of publication | [Au<sub>12</sub>(PPh<sub>2</sub>)<sub>2</sub>S<sub>4</sub>(L2)<sub>4</sub>]<sup>2+</sup> (L2 = 3,4-bis(diphenylphosphino)-2,5-bis(trimethylsilyloxy)furan): an Au<sub>12</sub> unit protected by modified maleic anhydride phosphine ligands. |
| Authors of publication | Yu, Wen; Wang, Yingxia; Fuhr, Olaf; Fenske, Dieter; Dehnen, Stefanie |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2018 |
| Journal volume | 47 |
| Journal issue | 4 |
| Pages of publication | 1032 - 1035 |
| a | 14.0681 ± 0.0003 Å |
| b | 19.0681 ± 0.0004 Å |
| c | 25.8449 ± 0.0006 Å |
| α | 69.532 ± 0.002° |
| β | 76.667 ± 0.002° |
| γ | 75.97 ± 0.02° |
| Cell volume | 6219.8 ± 0.5 Å3 |
| Cell temperature | 150.15 K |
| Ambient diffraction temperature | 150.15 K |
| Number of distinct elements | 9 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0682 |
| Residual factor for significantly intense reflections | 0.0574 |
| Weighted residual factors for significantly intense reflections | 0.1503 |
| Weighted residual factors for all reflections included in the refinement | 0.1575 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.958 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7045040.html
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