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Information card for entry 7045124
Preview
| Coordinates | 7045124.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C18 H16 Bi N4 O8 |
|---|---|
| Calculated formula | C18 H16 Bi N4 O8 |
| Title of publication | Exploring physical and chemical properties in new multifunctional indium-, bismuth-, and zinc-based 1D and 2D coordination polymers. |
| Authors of publication | Gomez, G. E.; D'vries, R. F.; Lionello, D. F.; Aguirre-Díaz, L M; Spinosa, M.; Costa, C. S.; Fuertes, M. C.; Pizarro, R. A.; Kaczmarek, A. M.; Ellena, J.; Rozes, L.; Iglesias, M.; Van Deun, R.; Sanchez, C.; Monge, M. A.; Soler-Illia, G J A A |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2018 |
| Journal volume | 47 |
| Journal issue | 6 |
| Pages of publication | 1808 - 1818 |
| a | 9.3852 ± 0.0006 Å |
| b | 9.6474 ± 0.0007 Å |
| c | 13.4442 ± 0.0009 Å |
| α | 72.378 ± 0.006° |
| β | 74.943 ± 0.006° |
| γ | 62.844 ± 0.007° |
| Cell volume | 1021.6 ± 0.14 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0757 |
| Residual factor for significantly intense reflections | 0.0425 |
| Weighted residual factors for significantly intense reflections | 0.0765 |
| Weighted residual factors for all reflections included in the refinement | 0.0894 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7045124.html
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Users of the data should acknowledge the original authors of the
structural data.