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Information card for entry 7045451
Preview
| Coordinates | 7045451.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | (ppy)2Ir(CH3CN)2 |
|---|---|
| Formula | C26 H22 Ir N4 |
| Calculated formula | C26 H22 Ir N4 |
| SMILES | c12cccc[n]2[Ir]2(c3c1cccc3)(c1c(cccc1)c1cccc[n]21)([N]#CC)[N]#CC |
| Title of publication | Ir(iii) complex-based phosphorescence and electrochemiluminescence chemodosimetric probes for Hg(ii) ions with high selectivity and sensitivity. |
| Authors of publication | Rhee, Hayoung; Kim, Taemin; Hong, Jong-In |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2018 |
| Journal volume | 47 |
| Journal issue | 11 |
| Pages of publication | 3803 - 3810 |
| a | 14.9543 ± 0.0004 Å |
| b | 20.0441 ± 0.0005 Å |
| c | 9.0693 ± 0.0002 Å |
| α | 90° |
| β | 103.535 ± 0.003° |
| γ | 90° |
| Cell volume | 2642.98 ± 0.12 Å3 |
| Cell temperature | 293 ± 0.4 K |
| Ambient diffraction temperature | 293 ± 0.4 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0385 |
| Residual factor for significantly intense reflections | 0.0346 |
| Weighted residual factors for significantly intense reflections | 0.095 |
| Weighted residual factors for all reflections included in the refinement | 0.0978 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.07 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7045451.html
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Users of the data should acknowledge the original authors of the
structural data.