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Information card for entry 7045515
Preview
| Coordinates | 7045515.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C14 H32 Br4 P2 Se2 |
|---|---|
| Calculated formula | C14 H32 Br4 P2 Se2 |
| SMILES | C([P](C(C)C)(CC[P](C(C)C)(C(C)C)[Se](Br)Br)[Se](Br)Br)(C)C |
| Title of publication | Bromination and iodination of diphosphane dichalcogenides. |
| Authors of publication | Upmann, Daniel; Jones, Peter G. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2018 |
| Journal volume | 47 |
| Journal issue | 8 |
| Pages of publication | 2748 - 2758 |
| a | 16.2568 ± 0.0005 Å |
| b | 9.4204 ± 0.0003 Å |
| c | 15.9393 ± 0.0006 Å |
| α | 90° |
| β | 107.253 ± 0.004° |
| γ | 90° |
| Cell volume | 2331.2 ± 0.14 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0385 |
| Residual factor for significantly intense reflections | 0.0323 |
| Weighted residual factors for significantly intense reflections | 0.0517 |
| Weighted residual factors for all reflections included in the refinement | 0.0531 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.205 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7045515.html
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