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Information card for entry 7050586
Preview
| Coordinates | 7050586.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H25 F3 N3 O2 P Pd |
|---|---|
| Calculated formula | C34 H25 F3 N3 O2 P Pd |
| SMILES | [Pd]1([P](c2ccc(F)cc2)(c2ccc(F)cc2)c2ccc(F)cc2)([N](=Nc2c1cccc2)c1ccccc1)N1C(=O)CCC1=O |
| Title of publication | Solid state conformational and theoretical study of complexes containing the (CxN)Pd moiety (CxN = 2-(phenylazo)phenyl-C,N and its derivatives) |
| Authors of publication | José Pérez; Luis García; Eduardo Pérez; José Luis Serrano; José Francisco Martínez; Gregorio Sánchez; Gregorio López; Arturo Espinosa; Malva Liu; Franciso Sanz |
| Journal of publication | New J. Chem. |
| Year of publication | 2003 |
| Journal volume | 27 |
| Journal issue | 10 |
| Pages of publication | 1490 - 1496 |
| a | 32.628 ± 0.007 Å |
| b | 11.079 ± 0.003 Å |
| c | 17.333 ± 0.004 Å |
| α | 90° |
| β | 101.969 ± 0.01° |
| γ | 90° |
| Cell volume | 6129 ± 3 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0925 |
| Residual factor for significantly intense reflections | 0.041 |
| Weighted residual factors for significantly intense reflections | 0.0946 |
| Weighted residual factors for all reflections included in the refinement | 0.1213 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.921 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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