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Information card for entry 7050588
Preview
| Coordinates | 7050588.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C29 H26 N3 O2 P Pd |
|---|---|
| Calculated formula | C29 H26 N3 O2 P Pd |
| SMILES | [Pd]1(c2c(N=[N]1c1ccccc1)cccc2)(N1C(=O)CCC1=O)[P](c1ccccc1)(c1ccccc1)C |
| Title of publication | Solid state conformational and theoretical study of complexes containing the (CxN)Pd moiety (CxN = 2-(phenylazo)phenyl-C,N and its derivatives) |
| Authors of publication | José Pérez; Luis García; Eduardo Pérez; José Luis Serrano; José Francisco Martínez; Gregorio Sánchez; Gregorio López; Arturo Espinosa; Malva Liu; Franciso Sanz |
| Journal of publication | New J. Chem. |
| Year of publication | 2003 |
| Journal volume | 27 |
| Journal issue | 10 |
| Pages of publication | 1490 - 1496 |
| a | 14.288 ± 0.0011 Å |
| b | 16.726 ± 0.0015 Å |
| c | 12.104 ± 0.002 Å |
| α | 90° |
| β | 112.836 ± 0.004° |
| γ | 90° |
| Cell volume | 2665.9 ± 0.5 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1397 |
| Residual factor for significantly intense reflections | 0.061 |
| Weighted residual factors for significantly intense reflections | 0.1215 |
| Weighted residual factors for all reflections included in the refinement | 0.1492 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.015 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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