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Information card for entry 7051274
Preview
| Coordinates | 7051274.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H28 N4 Ni O2 S4 |
|---|---|
| Calculated formula | C32 H28 N4 Ni O2 S4 |
| SMILES | [Ni]123SC(SCc4ccccc4)=N[N]2=Cc2ccccc2OCCOc2ccccc2C=[N]3N=C(S1)SCc1ccccc1 |
| Title of publication | Crystal structures, molecular packing and picosecond optical limiting properties of quadridentate Schiff base divalent metal complexes derived from S-benzyl dithiocarbazate |
| Authors of publication | Zhu, Xu-Hui; Chen, Xiao-Feng; Zhang, Yong; You, Xiao-Zeng; Tan, Wei-Lian; Ji, Wei; Vittal, Jaganese J.; Tan, Goek-Kheng; Kennard, Colin H. L. |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2000 |
| Journal volume | 24 |
| Journal issue | 6 |
| Pages of publication | 419 |
| a | 10.778 ± 0.002 Å |
| b | 11.882 ± 0.002 Å |
| c | 13.83 ± 0.002 Å |
| α | 81.079 ± 0.013° |
| β | 89.136 ± 0.014° |
| γ | 64.835 ± 0.014° |
| Cell volume | 1581.1 ± 0.5 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0639 |
| Residual factor for significantly intense reflections | 0.052 |
| Weighted residual factors for all reflections | 0.1596 |
| Weighted residual factors for significantly intense reflections | 0.1477 |
| Goodness-of-fit parameter for all reflections | 1.071 |
| Goodness-of-fit parameter for significantly intense reflections | 1.101 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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