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Information card for entry 7051357
Preview
| Coordinates | 7051357.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C8 H29 B10 N3 S2 |
|---|---|
| Calculated formula | C8 H29 B10 N3 S2 |
| SMILES | [S-][C]1234[BH]567[BH]89%10[BH]%11%12%13[BH]%14%158[BH]8%16%11[BH]%111([BH]3%158[BH]26%10%14)[BH]1%13%16[BH]59%12[C]47%111[S-].N#CC.C[NH2+]C.C[NH2+]C |
| Title of publication | Diborane(4) compounds incorporating thio- and seleno-carboranyl groups |
| Authors of publication | Norman, Nicholas C.; Guy Orpen, A.; Quayle, Michael J.; Rice, Craig R. |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2000 |
| Journal volume | 24 |
| Journal issue | 11 |
| Pages of publication | 837 |
| a | 11.209 ± 0.004 Å |
| b | 8.974 ± 0.004 Å |
| c | 19.784 ± 0.009 Å |
| α | 90° |
| β | 94.14 ± 0.04° |
| γ | 90° |
| Cell volume | 1984.9 ± 1.5 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.2283 |
| Residual factor for significantly intense reflections | 0.0931 |
| Weighted residual factors for all reflections | 0.1908 |
| Weighted residual factors for significantly intense reflections | 0.1406 |
| Goodness-of-fit parameter for all reflections | 1.009 |
| Goodness-of-fit parameter for significantly intense reflections | 1.146 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7051357.html
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Users of the data should acknowledge the original authors of the
structural data.