Information card for entry 7052037
| Formula |
C34 H53 N3 O Si2 Zn |
| Calculated formula |
C34 H53 N3 O Si2 Zn |
| SMILES |
[Zn]12(N([Si](C)(C)C)[Si](C)(C)C)[N](Cc3ccccc3)(Cc3[n]1cccc3)Cc1c(O2)c(C(C)(C)C)cc(C(C)(C)C)c1 |
| Title of publication |
Zinc and enolato-magnesium complexes based on bi-, tri- and tetradentate aminophenolate ligands |
| Authors of publication |
Zheng, Zhanjiang; Zhao, Gang; Fablet, Rémy; Bouyahyi, Miloud; Thomas, Christophe M.; Roisnel, Thierry; Casagrande Jr, Osvaldo; Carpentier, Jean-François |
| Journal of publication |
New Journal of Chemistry |
| Year of publication |
2008 |
| Journal volume |
32 |
| Journal issue |
12 |
| Pages of publication |
2279 |
| a |
15.2406 ± 0.0008 Å |
| b |
10.5921 ± 0.0006 Å |
| c |
48.038 ± 0.003 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
7754.8 ± 0.8 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
29 |
| Hermann-Mauguin space group symbol |
P c a 21 |
| Hall space group symbol |
P 2c -2ac |
| Residual factor for all reflections |
0.1008 |
| Residual factor for significantly intense reflections |
0.0843 |
| Weighted residual factors for significantly intense reflections |
0.2289 |
| Weighted residual factors for all reflections included in the refinement |
0.2364 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.179 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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