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Information card for entry 7052176
Preview
| Coordinates | 7052176.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C79 H80.5 Ba2 Cl8 N15.5 O45 S4 Zn2 |
|---|---|
| Calculated formula | C79 H78.5 Ba2 Cl8 N15.5 O45 S4 Zn2 |
| Title of publication | Electrostatic control of the formation of heteroleptic transition metal helicates |
| Authors of publication | Baylies, Christian J.; Harding, Lindsay P.; Jeffery, John C.; Moon, Ryan; Rice, Craig R.; Riis-Johannessen, T. |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2007 |
| Journal volume | 31 |
| Journal issue | 8 |
| Pages of publication | 1525 |
| a | 16.9511 ± 0.0003 Å |
| b | 18.4571 ± 0.0003 Å |
| c | 20.1644 ± 0.0004 Å |
| α | 108.458 ± 0.001° |
| β | 103.302 ± 0.001° |
| γ | 110.497 ± 0.001° |
| Cell volume | 5176.27 ± 0.18 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0771 |
| Residual factor for significantly intense reflections | 0.0525 |
| Weighted residual factors for significantly intense reflections | 0.1281 |
| Weighted residual factors for all reflections included in the refinement | 0.1419 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.996 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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