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Information card for entry 7052939
Preview
| Coordinates | 7052939.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H60 Ni S8 |
|---|---|
| Calculated formula | C32 H60 Ni S8 |
| SMILES | C(CCCCCC)SC1=C(S[Ni]2(S1)SC(=C(S2)SCCCCCCC)SCCCCCCC)SCCCCCCC |
| Title of publication | Synthesis, X-ray crystal structures, optical properties and modelling data of neutral bis(1,2-dithiolene) nickel complexes of the “non-cyclic SR” family |
| Authors of publication | Bui, Thanh-Tuan; Vuong, Minh Ha; Bonneval, Bénédicte Garreau-de; Alary, Fabienne; Kane, Jacob; Duhayon, Carine; Sournia-Saquet, Alix; Moineau-Chane-Ching, Kathleen I. |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2012 |
| Journal volume | 36 |
| Journal issue | 10 |
| Pages of publication | 2033 |
| a | 5.3358 ± 0.0006 Å |
| b | 13.3538 ± 0.0013 Å |
| c | 13.894 ± 0.0018 Å |
| α | 101.26 ± 0.01° |
| β | 90.396 ± 0.01° |
| γ | 101.111 ± 0.009° |
| Cell volume | 951.72 ± 0.19 Å3 |
| Cell temperature | 160 K |
| Ambient diffraction temperature | 160 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1399 |
| Residual factor for significantly intense reflections | 0.0457 |
| Weighted residual factors for all reflections | 0.1185 |
| Weighted residual factors for significantly intense reflections | 0.0508 |
| Weighted residual factors for all reflections included in the refinement | 0.0508 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.0969 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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