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Information card for entry 7053199
Preview
| Coordinates | 7053199.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H44 Cu N6 O6 S2 |
|---|---|
| Calculated formula | C32 H44 Cu N6 O6 S2 |
| Title of publication | Semiconducting nanostructured copper sulfide thin films from bidentate copper(ii) complexes of N-(dialkylcarbamothioyl)-nitrosubstituted benzamides by chemical vapour deposition |
| Authors of publication | Saeed, Sohail; Rashid, Naghmana; Hussain, Rizwan; Malik, Muhammad Azad; O'Brien, Paul; Wong, Wing-Tak |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2013 |
| Journal volume | 37 |
| Journal issue | 10 |
| Pages of publication | 3214 |
| a | 8.585 ± 0.002 Å |
| b | 12.347 ± 0.003 Å |
| c | 17.326 ± 0.004 Å |
| α | 85.325 ± 0.004° |
| β | 89.305 ± 0.004° |
| γ | 87.573 ± 0.004° |
| Cell volume | 1828.7 ± 0.7 Å3 |
| Cell temperature | 300 ± 2 K |
| Ambient diffraction temperature | 300 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.074 |
| Residual factor for significantly intense reflections | 0.0486 |
| Weighted residual factors for significantly intense reflections | 0.108 |
| Weighted residual factors for all reflections included in the refinement | 0.1185 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.054 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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