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Information card for entry 7053867
Preview
| Coordinates | 7053867.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Compound X |
|---|---|
| Formula | C18 H20 N2 O |
| Calculated formula | C19 H22 N2 O |
| SMILES | c1(ccc(cc1)/C=C/C=N/[C@H](CO)c1ccccc1)N(C)C |
| Title of publication | Synthesis and crystal structures of a series of Schiff bases: a photo-, solvato- and acidochromic compound |
| Authors of publication | Jiménez-Sánchez, Arturo; Rodríguez, Mario; Métivier, Rémi; Ramos-Ortíz, Gabriel; Maldonado, Jose Luis; Réboles, Netzahualcoyotl; Farfán, Norberto; Nakatani, Keitaro; Santillan, Rosa |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2014 |
| Journal volume | 38 |
| Journal issue | 2 |
| Pages of publication | 730 |
| a | 10.13 Å |
| b | 6.355 Å |
| c | 13.522 Å |
| α | 90° |
| β | 105.71° |
| γ | 90° |
| Cell volume | 837.977 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0458 |
| Residual factor for significantly intense reflections | 0.0365 |
| Weighted residual factors for significantly intense reflections | 0.085 |
| Weighted residual factors for all reflections included in the refinement | 0.0893 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.026 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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