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Information card for entry 7053871
Preview
| Coordinates | 7053871.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C53 H52 Cl4 N2 P2 Ru |
|---|---|
| Calculated formula | C53 H52 Cl4 N2 P2 Ru |
| SMILES | C1(N(C=CN1c1c(cc(cc1C)C)C)c1c(cc(cc1C)C)C)=[P](c1ccccc1)[Ru](=Cc1ccccc1)(Cl)(Cl)[P](c1ccccc1)(c1ccccc1)c1ccccc1.C(Cl)Cl |
| Title of publication | Reactivity study of low-coordinate phosphaalkene IMesPPh with Grubbs first-generation ruthenium benzylidene complexes |
| Authors of publication | Larocque, Timothy G.; Lavoie, Gino G. |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2014 |
| Journal volume | 38 |
| Journal issue | 2 |
| Pages of publication | 499 |
| a | 39.366 ± 0.004 Å |
| b | 10.3992 ± 0.0011 Å |
| c | 24.505 ± 0.003 Å |
| α | 90° |
| β | 104.747 ± 0.002° |
| γ | 90° |
| Cell volume | 9701.3 ± 1.9 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0579 |
| Residual factor for significantly intense reflections | 0.0367 |
| Weighted residual factors for significantly intense reflections | 0.0736 |
| Weighted residual factors for all reflections included in the refinement | 0.0834 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.018 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7053871.html
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