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Information card for entry 7058108
Preview
| Coordinates | 7058108.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C50.52 H66 Br4 Cl1.48 N8.52 Ni2 O14 Pb2 S2.52 |
|---|---|
| Calculated formula | C50.514 H58 Br4 Cl1.486 N8.514 Ni2 O14 Pb2 S2.514 |
| Title of publication | A tetranuclear nickel/lead complex with a salen type Schiff base: synthesis, structure and exploration of photosensitive Schottky barrier diode behaviour |
| Authors of publication | Roy, Sourav; Dey, Arka; Drew, Michael G. B.; Ray, Partha Pratim; Chattopadhyay, Shouvik |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2019 |
| Journal volume | 43 |
| Journal issue | 13 |
| Pages of publication | 5020 |
| a | 38.41 ± 0.003 Å |
| b | 38.41 ± 0.003 Å |
| c | 12.7948 ± 0.0011 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 16348 ± 2 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 9 |
| Space group number | 148 |
| Hermann-Mauguin space group symbol | R -3 :H |
| Hall space group symbol | -R 3 |
| Residual factor for all reflections | 0.1271 |
| Residual factor for significantly intense reflections | 0.0722 |
| Weighted residual factors for significantly intense reflections | 0.1178 |
| Weighted residual factors for all reflections included in the refinement | 0.1346 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.989 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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