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Information card for entry 7060434
Preview
| Coordinates | 7060434.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H52 B Cu F4 N8 S4 |
|---|---|
| Calculated formula | C44 H52 B Cu F4 N8 S4 |
| SMILES | [Cu]12([S]=C3N(c4c(N3C(C)C)cccc4)CCN3C(=[S]1)N(c1c3cccc1)C(C)C)[S]=C1N(C(C)C)c3c(cccc3)N1CCN1C(=[S]2)N(C(C)C)c2c1cccc2.[B](F)(F)(F)[F-] |
| Title of publication | Rare proximity enforced copper hydrogen interactions in copper(i)-chalcogenones |
| Authors of publication | Mannarsamy, Maruthupandi; Prabusankar, Ganesan |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2021 |
| Journal volume | 45 |
| Journal issue | 13 |
| Pages of publication | 5933 - 5938 |
| a | 33.0313 ± 0.0004 Å |
| b | 13.34528 ± 0.00014 Å |
| c | 22.2766 ± 0.0002 Å |
| α | 90° |
| β | 92.7456 ± 0.001° |
| γ | 90° |
| Cell volume | 9808.52 ± 0.18 Å3 |
| Cell temperature | 298 K |
| Ambient diffraction temperature | 298 K |
| Number of distinct elements | 7 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0612 |
| Residual factor for significantly intense reflections | 0.0506 |
| Weighted residual factors for significantly intense reflections | 0.1566 |
| Weighted residual factors for all reflections included in the refinement | 0.1726 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.05 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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