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Information card for entry 7060973
Preview
| Coordinates | 7060973.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C80 H76 O16 Si8 Sn2 |
|---|---|
| Calculated formula | C80 H76 O16 Si8 Sn2 |
| Title of publication | Assembly of discrete and oligomeric structures of organotin double-decker silsesquioxanes: inherent stability studies |
| Authors of publication | Loganathan, Pushparaj; Pillai, Renjith S.; Jeevananthan, Velusamy; David, Ezhumalai; Palanisami, Nallasamy; Bhuvanesh, Nattamai S. P.; Shanmugan, Swaminathan |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2021 |
| Journal volume | 45 |
| Journal issue | 43 |
| Pages of publication | 20144 - 20154 |
| a | 23.419 ± 0.002 Å |
| b | 13.5736 ± 0.001 Å |
| c | 24.9877 ± 0.0018 Å |
| α | 90° |
| β | 90.902 ± 0.003° |
| γ | 90° |
| Cell volume | 7942.1 ± 1.1 Å3 |
| Cell temperature | 110 K |
| Ambient diffraction temperature | 110 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0246 |
| Residual factor for significantly intense reflections | 0.0228 |
| Weighted residual factors for significantly intense reflections | 0.0549 |
| Weighted residual factors for all reflections included in the refinement | 0.0564 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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