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Information card for entry 7062029
Preview
| Coordinates | 7062029.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C25 H23 B F4 O2 S Te |
|---|---|
| Calculated formula | C25 H23 B F4 O2 S Te |
| SMILES | [Te+](OC)(c1ccc2c3c(ccc(Sc4ccccc4)c13)CC2)c1ccccc1.[B](F)(F)(F)[F-].O |
| Title of publication | Chalcogen controlled redox behaviour in peri-substituted S, Se and Te naphthalene derivatives |
| Authors of publication | Roemmele, Tracey L.; Knight, Fergus R.; Crawford, Ellis; Robertson, Stuart D.; Bode, Bela E.; Bühl, Michael; Slawin, Alexandra M. Z.; Woollins, J. Derek; Boeré, René T. |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2022 |
| Journal volume | 46 |
| Journal issue | 46 |
| Pages of publication | 22363 - 22383 |
| a | 11.7625 ± 0.0019 Å |
| b | 14.972 ± 0.004 Å |
| c | 15.39 ± 0.003 Å |
| α | 83.26 ± 0.03° |
| β | 71.08 ± 0.02° |
| γ | 68.25 ± 0.02° |
| Cell volume | 2381.3 ± 1 Å3 |
| Cell temperature | 125 K |
| Ambient diffraction temperature | 125.15 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1284 |
| Residual factor for significantly intense reflections | 0.0758 |
| Weighted residual factors for significantly intense reflections | 0.1447 |
| Weighted residual factors for all reflections included in the refinement | 0.174 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.071 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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