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Information card for entry 7062031
Preview
| Coordinates | 7062031.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C26 H25 B F4 O2 Te2 |
|---|---|
| Calculated formula | C26 H25 B F4 O2 Te2 |
| SMILES | [Te+](OC)(c1ccc2c3c(ccc([Te]c4ccccc4)c13)CC2)c1ccccc1.[B](F)(F)(F)[F-].OC |
| Title of publication | Chalcogen controlled redox behaviour in peri-substituted S, Se and Te naphthalene derivatives |
| Authors of publication | Roemmele, Tracey L.; Knight, Fergus R.; Crawford, Ellis; Robertson, Stuart D.; Bode, Bela E.; Bühl, Michael; Slawin, Alexandra M. Z.; Woollins, J. Derek; Boeré, René T. |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2022 |
| Journal volume | 46 |
| Journal issue | 46 |
| Pages of publication | 22363 - 22383 |
| a | 10.593 ± 0.003 Å |
| b | 11.1 ± 0.002 Å |
| c | 12.01 ± 0.002 Å |
| α | 61.571 ± 0.014° |
| β | 85.183 ± 0.018° |
| γ | 87.92 ± 0.02° |
| Cell volume | 1237.5 ± 0.5 Å3 |
| Cell temperature | 93 K |
| Ambient diffraction temperature | 93.15 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0436 |
| Residual factor for significantly intense reflections | 0.0345 |
| Weighted residual factors for significantly intense reflections | 0.0538 |
| Weighted residual factors for all reflections included in the refinement | 0.0576 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.035 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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