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Information card for entry 7063843
Preview
| Coordinates | 7063843.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [(MeSe)2(MeS)2TTF][ClO4] |
|---|---|
| Chemical name | 4,5-bis(methylseleno)-4',5'-bis(methylthio)-tetrathiafulvalenium, perchlorate |
| Formula | C10 H12 Cl O4 S6 Se2 |
| Calculated formula | C10 H12 Cl O4 S6 Se2 |
| Title of publication | Activation of chalcogen bonding in tetrathiafulvalene derivatives with Se/S differentiation |
| Authors of publication | Beau, Maxime; Jeon, Ie-Rang; Jeannin, Olivier; Guizouarn, Thierry; Fourmigué, Marc |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2025 |
| Journal volume | 49 |
| Journal issue | 26 |
| Pages of publication | 11501 - 11508 |
| a | 7.617 ± 0.0008 Å |
| b | 10.9542 ± 0.0012 Å |
| c | 12.889 ± 0.0014 Å |
| α | 110.984 ± 0.003° |
| β | 97.116 ± 0.004° |
| γ | 101.161 ± 0.003° |
| Cell volume | 962.96 ± 0.18 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0761 |
| Residual factor for significantly intense reflections | 0.0472 |
| Weighted residual factors for significantly intense reflections | 0.0998 |
| Weighted residual factors for all reflections included in the refinement | 0.1194 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.139 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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