Information card for entry 7101905
| Formula |
C22 H54 Ag2 N2 O8 P2 S4 Te2 |
| Calculated formula |
C22 H54 Ag2 N2 O8 P2 S4 Te2 |
| SMILES |
N([Ag]1[Te](=P(C(C)C)(C(C)C)C(C)C)[Ag](N(S(=O)(=O)C)S(=O)(=O)C)[Te]1=P(C(C)C)(C(C)C)C(C)C)(S(=O)(=O)C)S(=O)(=O)C |
| Title of publication |
The first trialkylphosphane telluride complexes of Ag(I): molecular, ionic and supramolecular structural alternatives |
| Authors of publication |
Daniliuc, Constantin; Druckenbrodt, Christian; Hrib, Cristian G.; Ruthe, Frank; Blaschette, Armand; Jones, Peter G.; du Mont, Wolf-W. |
| Journal of publication |
Chemical Communications (Cambridge, United Kingdom) |
| Year of publication |
2007 |
| Journal issue |
20 |
| Pages of publication |
2060 - 2062 |
| a |
11.7663 ± 0.0015 Å |
| b |
7.794 ± 0.002 Å |
| c |
21.802 ± 0.004 Å |
| α |
90° |
| β |
105.457 ± 0.015° |
| γ |
90° |
| Cell volume |
1927.1 ± 0.6 Å3 |
| Cell temperature |
143 ± 2 K |
| Ambient diffraction temperature |
143 ± 2 K |
| Number of distinct elements |
8 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0359 |
| Residual factor for significantly intense reflections |
0.0284 |
| Weighted residual factors for significantly intense reflections |
0.0557 |
| Weighted residual factors for all reflections included in the refinement |
0.0594 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.056 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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