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Information card for entry 7102027
Preview
| Coordinates | 7102027.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | La2@C80(Dep2Si)2CH2 |
|---|---|
| Formula | C122 H54 La2 S2 Si2 |
| Calculated formula | C122 H54 La2 S2 Si2 |
| Title of publication | Two-dimensional hopping motion of encapsulated La atoms in silylated La(2)@C(80). |
| Authors of publication | Wakahara, Takatsugu; Yamada, Michio; Takahashi, Satomi; Nakahodo, Tsukasa; Tsuchiya, Takahiro; Maeda, Yutaka; Akasaka, Takeshi; Kako, Masahiro; Yoza, Kenji; Horn, Ernst; Mizorogi, Naomi; Nagase, Shigeru |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2007 |
| Journal issue | 26 |
| Pages of publication | 2680 - 2682 |
| a | 18.234 ± 0.002 Å |
| b | 19.326 ± 0.003 Å |
| c | 20.834 ± 0.003 Å |
| α | 90° |
| β | 90.445 ± 0.002° |
| γ | 90° |
| Cell volume | 7341.48 Å3 |
| Cell temperature | 90 ± 2 K |
| Ambient diffraction temperature | 90 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1368 |
| Residual factor for significantly intense reflections | 0.1165 |
| Weighted residual factors for significantly intense reflections | 0.2903 |
| Weighted residual factors for all reflections included in the refinement | 0.3006 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.176 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7102027.html
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