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Information card for entry 7104280
Preview
| Coordinates | 7104280.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C40 H48 N4 P2 |
|---|---|
| Calculated formula | C40 H48 N4 P2 |
| SMILES | N1(P(N(C=C1)c1c(cc(cc1C)C)C)P1N(C=CN1c1c(cc(cc1C)C)C)c1c(cc(cc1C)C)C)c1c(C)cc(cc1C)C |
| Title of publication | Formation of a new class of 7pi radicals via sterically induced P-P bond cleavage of the dimers [(CH)2(NR)2P]2. |
| Authors of publication | Edge, Ruth; Less, Robert J; McInnes, Eric J L; Müther, Kristine; Naseri, Vesal; Rawson, Jeremy M; Wright, Dominic S |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2009 |
| Journal volume | 34 |
| Journal issue | 13 |
| Pages of publication | 1691 - 1693 |
| a | 8.6059 ± 0.0003 Å |
| b | 10.2485 ± 0.0004 Å |
| c | 10.8287 ± 0.0004 Å |
| α | 85.8725 ± 0.0016° |
| β | 74.5382 ± 0.0017° |
| γ | 73.0208 ± 0.0014° |
| Cell volume | 880.36 ± 0.06 Å3 |
| Cell temperature | 180 ± 2 K |
| Ambient diffraction temperature | 180 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.107 |
| Residual factor for significantly intense reflections | 0.0627 |
| Weighted residual factors for significantly intense reflections | 0.1158 |
| Weighted residual factors for all reflections included in the refinement | 0.1346 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.091 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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