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Information card for entry 7104665
Preview
| Coordinates | 7104665.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C12 H17 Re S5 |
|---|---|
| Calculated formula | C12 H17 Re S5 |
| SMILES | [Re]12(=S)(SCC[S]1CC(C)(C)S2)Sc1ccccc1 |
| Title of publication | Subtle chirality in oxo- and sulfidorhenium(v) complexes. |
| Authors of publication | De Montigny, Frederic; Guy, Laure; Pilet, Guillaume; Vanthuyne, Nicolas; Roussel, Christian; Lombardi, Rosina; Freedman, Teresa B; Nafie, Laurence A; Crassous, Jeanne |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2009 |
| Journal volume | 34 |
| Journal issue | 32 |
| Pages of publication | 4841 - 4843 |
| a | 11.4981 ± 0.0003 Å |
| b | 16.0118 ± 0.0005 Å |
| c | 18.253 ± 0.0004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3360.47 ± 0.16 Å3 |
| Cell temperature | 290 K |
| Ambient diffraction temperature | 290 K |
| Number of distinct elements | 4 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.091 |
| Residual factor for significantly intense reflections | 0.0492 |
| Weighted residual factors for all reflections | 0.1211 |
| Weighted residual factors for significantly intense reflections | 0.0603 |
| Weighted residual factors for all reflections included in the refinement | 0.0603 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.0841 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7104665.html
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Users of the data should acknowledge the original authors of the
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