Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7104955
Preview
| Coordinates | 7104955.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C72 H162 Nb2 O6 P2 Si6 |
|---|---|
| Calculated formula | C72 H162 Nb2 O6 P2 Si6 |
| Title of publication | [(silox)(3)M](2)(mu:eta(1),eta(1)-P(2)) (M = Nb, Ta) and [(silox)(3)Nb](2){mu:eta(2),eta(2)-((c)P(3)-(c)P(3))} from (silox)(3)M (M = NbPMe(3), Ta) and P(4) (silox = (t)Bu(3)SiO). |
| Authors of publication | Hulley, Elliott B; Wolczanski, Peter T; Lobkovsky, Emil B |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2009 |
| Journal issue | 42 |
| Pages of publication | 6412 - 6414 |
| a | 12.9765 ± 0.0006 Å |
| b | 13.143 ± 0.0006 Å |
| c | 16.0885 ± 0.0008 Å |
| α | 67.128 ± 0.002° |
| β | 68.43 ± 0.002° |
| γ | 61.974 ± 0.002° |
| Cell volume | 2173.19 ± 0.18 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0527 |
| Residual factor for significantly intense reflections | 0.0393 |
| Weighted residual factors for significantly intense reflections | 0.0876 |
| Weighted residual factors for all reflections included in the refinement | 0.0939 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.065 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7104955.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.