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Information card for entry 7105680
Preview
| Coordinates | 7105680.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C49 H62 N4 P2 S2 Si4 Ta2 |
|---|---|
| Calculated formula | C49 H62 N4 P2 S2 Si4 Ta2 |
| SMILES | C1[Si](C)(C)N(c2ccccc2)[Ta]2345(N(c6ccccc6)[Si](C[P]12c1ccccc1)(C)C)C[Ta]125(N(c5ccccc5)[Si](C[P]2(C[Si](C)(C)N1c1ccccc1)c1ccccc1)(C)C)(S3)S4 |
| Title of publication | Complete disassembly of carbon disulfide by a ditantalum complex |
| Authors of publication | Joachim Ballmann; Alyssa Yeo; Bruce MacKay; Sabine van Rjit; Brian Patrick; Michael Fryzuk |
| Journal of publication | Chem.Commun. |
| Year of publication | 2010 |
| Journal volume | 46 |
| Pages of publication | 8794 |
| a | 21.9524 ± 0.0008 Å |
| b | 21.7688 ± 0.0009 Å |
| c | 24.637 ± 0.001 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 11773.5 ± 0.8 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 60 |
| Hermann-Mauguin space group symbol | P b c n |
| Hall space group symbol | -P 2n 2ab |
| Residual factor for all reflections | 0.0922 |
| Residual factor for significantly intense reflections | 0.0368 |
| Weighted residual factors for significantly intense reflections | 0.0857 |
| Weighted residual factors for all reflections included in the refinement | 0.101 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.015 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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