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Information card for entry 7106032
Preview
| Coordinates | 7106032.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C53 H73 Al N4 O Zn |
|---|---|
| Calculated formula | C53 H73 Al N4 O Zn |
| SMILES | [Zn]1(N(C(=CC(=[N]1c1c(cc(cc1C)C)C)C)C)c1c(cc(cc1C)C)C)O[Al]1(N(C(=CC(=[N]1c1c(cccc1C(C)C)C(C)C)C)C)c1c(cccc1C(C)C)C(C)C)C |
| Title of publication | X-Ray crystal structure of a heterobimetallic AlZn-oxide complex |
| Authors of publication | Stephan Schulz; Jan Spielmann; Dieter Blaser; Christoph Wolper |
| Journal of publication | Chem.Commun. |
| Year of publication | 2011 |
| Journal volume | 47 |
| Pages of publication | 2676 |
| a | 12.4832 ± 0.001 Å |
| b | 22.036 ± 0.002 Å |
| c | 19.0101 ± 0.0016 Å |
| α | 90° |
| β | 98.078 ± 0.004° |
| γ | 90° |
| Cell volume | 5177.4 ± 0.8 Å3 |
| Cell temperature | 203 ± 2 K |
| Ambient diffraction temperature | 203 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0946 |
| Residual factor for significantly intense reflections | 0.0547 |
| Weighted residual factors for significantly intense reflections | 0.1406 |
| Weighted residual factors for all reflections included in the refinement | 0.1614 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.014 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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