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Information card for entry 7110316
Preview
| Coordinates | 7110316.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | 03049 |
|---|---|
| Formula | C46.5 H42 O2 P2 Pd |
| Calculated formula | C46.5 H42 O2 P2 Pd |
| Title of publication | Mixed metal bis(�-oxo) complexes with [CuM(�-O)2]n+ (M = Ni(iii) or Pd(ii)) coresElectronic supplementary information (ESI) available: experimental and calculation details. See http://www.rsc.org/suppdata/cc/b4/b404640d/ |
| Authors of publication | Aboelella, Nermeen W.; York, John T.; Reynolds, Anne M.; Fujita, Koyu; Kinsinger, Christopher R.; Cramer, Christopher J.; Riordan, Charles G.; Tolman, William B. |
| Journal of publication | Chemical Communications |
| Year of publication | 2004 |
| Journal issue | 15 |
| Pages of publication | 1716 - 1717 |
| a | 9.2639 ± 0.0014 Å |
| b | 23.168 ± 0.004 Å |
| c | 18.26 ± 0.003 Å |
| α | 90° |
| β | 92.962 ± 0.003° |
| γ | 90° |
| Cell volume | 3913.8 ± 1.1 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0626 |
| Residual factor for significantly intense reflections | 0.0368 |
| Weighted residual factors for significantly intense reflections | 0.0831 |
| Weighted residual factors for all reflections included in the refinement | 0.0949 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.066 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7110316.html
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