Information card for entry 7110410

Structure parameters

• Formula: C32 H76 K2 N6 Si4
• Calculated formula: C32 H76 K2 N6 Si4
• SMILES: [K]1(=C2N(CCCN2C(C)C)C(C)C)[N]([Si](C)(C)C)([Si](C)(C)C)[K](=C2N(CCCN2C(C)C)C(C)C)[N]1([Si](C)(C)C)[Si](C)(C)C
• Title of publication: Complexation of stable carbenes with alkali metals
• Authors of publication: Alder, Roger W.; Blake, Michael E.; Bortolotti, Christel; Bufali, Simone; Butts, Craig P.; Linehan, Emma; Oliva, Josep M.; Guy Orpen, A.; Quayle, Michael J.
• Journal of publication: Chemical Communications
• Year of publication: 1999
• Journal issue: 3
• Pages of publication: 241
• a: 9.4128 ± 0.0012 Å
• b: 10.937 ± 0.003 Å
• c: 12.306 ± 0.002 Å
• α: 73.97 ± 0.02°
• β: 73.132 ± 0.012°
• γ: 69.426 ± 0.01°
• Cell volume: 1113.4 ± 0.4 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0343
• Residual factor for significantly intense reflections: 0.0266
• Weighted residual factors for all reflections: 0.0762
• Weighted residual factors for significantly intense reflections: 0.0743
• Goodness-of-fit parameter for all reflections: 0.988
• Goodness-of-fit parameter for significantly intense reflections: 1.077
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No