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Information card for entry 7110643
Preview
| Coordinates | 7110643.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | (Ph4As)2[Ru(S2C2(CN)2]3 |
|---|---|
| Formula | C60 H40 As2 N6 Ru S6 |
| Calculated formula | C60 H40 As2 N6 Ru S6 |
| SMILES | [As+](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1.C1(S[Ru]23(SC=1C#N)(SC(=C(S3)C#N)C#N)SC(C#N)=C(S2)C#N)C#N.[As+](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication | A ruthenium(IV) complex with six sulfur donor atoms |
| Authors of publication | Maiti, Rabindranath; Shang, Maoyu; Graham Lappin, A. |
| Journal of publication | Chemical Communications |
| Year of publication | 1999 |
| Journal issue | 23 |
| Pages of publication | 2349 |
| a | 20.399 ± 0.002 Å |
| b | 15.674 ± 0.002 Å |
| c | 18.02 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 5761.6 ± 1.1 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 60 |
| Hermann-Mauguin space group symbol | P b c n |
| Hall space group symbol | -P 2n 2ab |
| Residual factor for all reflections | 0.0898 |
| Residual factor for significantly intense reflections | 0.0471 |
| Weighted residual factors for all reflections | 0.1124 |
| Weighted residual factors for significantly intense reflections | 0.0999 |
| Goodness-of-fit parameter for all reflections | 0.984 |
| Goodness-of-fit parameter for significantly intense reflections | 1.167 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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