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Information card for entry 7111274
Preview
| Coordinates | 7111274.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H54 P2 Ru2 |
|---|---|
| Calculated formula | C44 H54 P2 Ru2 |
| SMILES | [c]12([c]3([c]4([c]5([c]1(C)[Ru]162345[P]2(C=C(C(=C2c2ccccc2)C)C)[Ru]23456([P]61C=C(C(=C6c1ccccc1)C)C)[c]1([c]2([c]3([c]4([c]51C)C)C)C)C)C)C)C)C |
| Title of publication | Synthesis of 2-silyl substituted phospharuthenocenes and an elaboration into the first phospharuthenocene-phosphine |
| Authors of publication | Carmichael, Duncan; Mathey, François; Ricard, Louis; Seeboth, Nicolas |
| Journal of publication | Chemical Communications |
| Year of publication | 2002 |
| Journal issue | 24 |
| Pages of publication | 2976 - 2977 |
| a | 11.087 ± 0.005 Å |
| b | 14.757 ± 0.005 Å |
| c | 12.041 ± 0.005 Å |
| α | 90° |
| β | 96.34 ± 0.005° |
| γ | 90° |
| Cell volume | 1958 ± 1.4 Å3 |
| Cell temperature | 150 ± 1 K |
| Ambient diffraction temperature | 150 ± 1 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0582 |
| Residual factor for significantly intense reflections | 0.0388 |
| Weighted residual factors for significantly intense reflections | 0.0973 |
| Weighted residual factors for all reflections included in the refinement | 0.1072 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.074 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7111274.html
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Users of the data should acknowledge the original authors of the
structural data.