Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7113404
Preview
| Coordinates | 7113404.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C45 H47 Gd N8 O9 |
|---|---|
| Calculated formula | C45 H44 Gd N8 O9 |
| SMILES | c12c3[n]4c5ccccc5c(c3CCc2c(c2c3[n]1[Gd]1564([n]4c7ccccc7c(c(c34)CC2)C)([O]=N(=O)O1)(ON(=O)=[O]5)ON(=O)=[O]6)c1ccc(N(CCCC)CCCC)cc1)C.C(C)#N |
| Title of publication | First lanthanide dipolar complexes for second-order nonlinear optics. |
| Authors of publication | Sénéchal, Katell; Toupet, Loïc; Ledoux, Isabelle; Zyss, Joseph; Le Bozec, Hubert; Maury, Olivier |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2004 |
| Journal issue | 19 |
| Pages of publication | 2180 - 2181 |
| a | 48.415 ± 0.001 Å |
| b | 48.415 ± 0.001 Å |
| c | 10.6278 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 21574.2 ± 0.7 Å3 |
| Cell temperature | 120 ± 1 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 148 |
| Hermann-Mauguin space group symbol | R -3 :H |
| Hall space group symbol | -R 3 |
| Residual factor for all reflections | 0.183 |
| Residual factor for significantly intense reflections | 0.0944 |
| Weighted residual factors for significantly intense reflections | 0.2424 |
| Weighted residual factors for all reflections included in the refinement | 0.3029 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.02 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7113404.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.